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Characterization of Defects in Perovskite Thin Film Materials Using Microscopic Techniques

Yanan Zhang, Guangliang Yao, Jie Chu

Abstract


In recent years many efforts have been made to figure out the underlying photophysical mechanisms operated in the perovskite-based devices. Observing and understanding these defects through experimental characterization methods is a necessary step to obtain high-performance perovskite. Herein, we attempt to systematically summarize the defect determination techniques based on microscopy from the scale of single perovskite layer, emphasizing the representative mechanisms of microscopy in explaining the defects.

Keywords


Material defects; Microtechnology; Perovskite thin film

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DOI: http://dx.doi.org/10.18686/ahe.v7i14.8656

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